Accuracy and Invasiveness of Direct Electrooptic Sampling of Gallium Arsenide Integrated Circuits
Gavisetty, S. Vaughan, and K.S. Wills, aquot;Electron beam testing and its application to VLSI technologyaquot; Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, R. Jain, Editor, SPIE Vol. 795, pp. 166-177 (1987).
| Title | : | Accuracy and Invasiveness of Direct Electrooptic Sampling of Gallium Arsenide Integrated Circuits |
| Author | : | James L. Freeman (Jr.) |
| Publisher | : | - 1988 |
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